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Proceedings Paper

Application of computer-processed video signal in the optics of thin films
Author(s): Ludek Bartonek; Jiri Keprt
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Paper Abstract

The interferometric measurement method of a thin film optical thickness is presented in this report. This measurement is realized by Michelson's interferometer. Interferogram of a measured sample with one half of the surface covered by a laser and the other without a layer is digitally recorded from the screen by CCD camera. The video- signal from two rows of the intensity distribution from the part with and without a layer are numerically filtered via fast Fourier transformation and the phase change of the two periodical 'continuous' functions is evaluated by the first and second derivatives. This phase change allows to determine the path difference and finally the optical thickness of the layer.

Paper Details

Date Published: 7 March 2001
PDF: 7 pages
Proc. SPIE 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, (7 March 2001); doi: 10.1117/12.417828
Show Author Affiliations
Ludek Bartonek, Palacky Univ. (Czech Republic)
Jiri Keprt, Palacky Univ. and Institute of Physics (Czech Republic)


Published in SPIE Proceedings Vol. 4356:
12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Jan Perina Sr.; Miroslav Hrabovsky; Jaromir Krepelka, Editor(s)

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