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Proceedings Paper

Recent developments in electronic speckle pattern interferometry
Author(s): Krzysztof Patorski
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Paper Abstract

Electronic speckle pattern interferometry pioneered 30 years ago, represents one of the most powerful tools for industrial nondestructive testing and metrology. Main advantages include speed of data acquisition and processing, relative simplicity and possibility to work outside the laboratory. Steady progress in optoelectronics, fiber technology, and informatics facilitates the development of compact and robust systems for new tasks in engineering analysis.

Paper Details

Date Published: 7 March 2001
PDF: 9 pages
Proc. SPIE 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, (7 March 2001); doi: 10.1117/12.417816
Show Author Affiliations
Krzysztof Patorski, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 4356:
12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Jan Perina; Miroslav Hrabovsky; Jaromir Krepelka, Editor(s)

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