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Proceedings Paper

Technique of computer analysis of thermally stimulated depolarization currents
Author(s): Sergey N. Koykov; Yury A. Panteleev; Elena A. Rodionova
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Paper Abstract

In this paper a technique of fitting of experimental data of thermally stimulated depolarization (TSD) (one of the widespread methods of dielectrics and high resistance semiconductors investigation, including parts of electrotechnical devices) is proposed. Theoretical substantiation and practical application of new methods of computer simulation for analysis of TSD currents are considered. Specific examples of experimental data fitting are given. Edges of the technique are shown. Some methods of computer simulation are recommended to experimenters for wide use.

Paper Details

Date Published: 1 February 2001
PDF: 8 pages
Proc. SPIE 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (1 February 2001); doi: 10.1117/12.417688
Show Author Affiliations
Sergey N. Koykov, St. Petersburg State Technical Univ. (Russia)
Yury A. Panteleev, St. Petersburg State Technical Univ. (Russia)
Elena A. Rodionova, St. Petersburg State Technical Univ. (Russia)


Published in SPIE Proceedings Vol. 4348:
Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

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