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Proceedings Paper

Electron spin interferometry
Author(s): Christian H. Back; Stefan Egger; Joerg Krewer; Danilo Pescia
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Paper Abstract

In a simple experiment, we monitor interference effects for low energy electrons in thin magnetic Co-films as well as in a spin quantum resonator structure consisting of a Cu-film of variable thickness sandwiched between vacuum and a magnetic Co-film. In the case of the Co-film the incident electrons are unpolarized and we observe oscillations with a period of one monolayer as a function of Co-thickness when we measure the intensity of the reflected electron beam. We attribute these oscillations to the changing morphology of the Co film as a function of thickness. In the case of the sandwich structure, spin polarized electrons are injected into the resonator from the vacuum side. The Co-film provides a spin dependent reflector. Varying the resonator thickness results in periodic switching of the spin state of the specularly reflected electrons. We apply spin interferometry to study oscillatory interlayer exchange coupling and find a divergence of the coupling period predicted by theory.

Paper Details

Date Published: 1 February 2001
PDF: 3 pages
Proc. SPIE 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (1 February 2001); doi: 10.1117/12.417687
Show Author Affiliations
Christian H. Back, Eidgenoessische Technische Hochshule Zuerich (Switzerland)
Stefan Egger, Eidgenoessische Technische Hochshule Zuerich (Switzerland)
Joerg Krewer, Blaupunkt-Werke GmbH (Germany)
Danilo Pescia, Eidgenoessiche Technische Hochschule Zuerich (Switzerland)


Published in SPIE Proceedings Vol. 4348:
Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

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