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Proceedings Paper

Mathematical modeling of field electron emission from semiconductor with electrical centroid rule
Author(s): Valery P. Denissov; Marina I. Varajun
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Paper Abstract

Development of vacuum microelectronics, polarized electron sources, and flat displays renewed interest in field electron emission from semiconductors. In the report some results of mathematical modeling of this phenomenon are presented with electron escape probability calculated with 'electrical centroid rule' for 2D layer at a surface. Advantages of such approach compared to the conventional image force account are discussed for flat and nano-tip emitters. The current-voltage plots are constructed for some promising emitters.

Paper Details

Date Published: 1 February 2001
PDF: 4 pages
Proc. SPIE 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (1 February 2001); doi: 10.1117/12.417676
Show Author Affiliations
Valery P. Denissov, St. Petersburg State Univ. (Russia)
Marina I. Varajun, St. Petersburg State Univ. (Russia)


Published in SPIE Proceedings Vol. 4348:
Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

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