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Proceedings Paper

Application of the scanning Kelvin microscopy for nondestructive material characterization
Author(s): Andrej Ivankov; Robert Blum; Torsten Prasse; Jan Sandler; Wolfang Bauhofer
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Paper Abstract

Scanning Kelvin microscopy (SKM) has been applied to the characterization of poled non-linear optical (NLO) polymer films, carbon black filled epoxy polymers and sulfur- passivated GaAs(100). This paper demonstrates that SKM is applicable to the detection of the magnitude and the direction of the field-induced polarization in poled NLO polymer films. We compare the response to that obtained from the scanning second-harmonic-microscopy method in which the direction of the orientation cannot be seen. A local illumination of the GaAs(100) surface during treatment in sodium sulfide solutions has significant influence on the work function distribution on the passivated surface. The image of the lateral distribution of the carbon black electrical network in epoxy resin by SKM is demonstrated.

Paper Details

Date Published: 1 February 2001
PDF: 5 pages
Proc. SPIE 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (1 February 2001); doi: 10.1117/12.417638
Show Author Affiliations
Andrej Ivankov, Technische Univ. Hamburg-Harburg (Germany)
Robert Blum, Technische Univ. Hamburg-Harburg (Germany)
Torsten Prasse, Technische Univ. Hamburg-Harburg (Germany)
Jan Sandler, Technische Univ. Hamburg-Harburg (Germany)
Wolfang Bauhofer, Technische Univ. Hamburg-Harburg (Germany)


Published in SPIE Proceedings Vol. 4348:
Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

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