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Proceedings Paper

Rearrangement effects in inner-shell photodetachment from Sn-negative ion
Author(s): Vadim K. Ivanov; Galina Yu. Kashenock; Constantin V. Lapkin
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Paper Abstract

In this contribution we present the results of many-body calculation on electron photodetachment from inner subshells of Sn- negative ion. The main attention is paid to qualitative changes in the near threshold 4d cross section induced by rearrangement effects.

Paper Details

Date Published: 1 February 2001
PDF: 6 pages
Proc. SPIE 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (1 February 2001); doi: 10.1117/12.417628
Show Author Affiliations
Vadim K. Ivanov, St. Petersburg State Technical Univ. (Russia)
Galina Yu. Kashenock, St. Petersburg State Technical Univ. (Russia)
Constantin V. Lapkin, St. Petersburg State Technical Univ. (Russia)


Published in SPIE Proceedings Vol. 4348:
Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

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