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Proceedings Paper

Pilot investigation of automatic comparison of striation marks with structured light
Author(s): Zeno J. Geradts; Dennis Zaal; Huub Hardy; Jos Lelieveld; Isaac Keereweer; Jurrien Bijhold
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Paper Abstract

We have developed and tested an algorithm that can compare striation marks that are acquired with a standard camera and sidelight as well as 3D-information acquired with structured light.

Paper Details

Date Published: 21 February 2001
PDF: 8 pages
Proc. SPIE 4232, Enabling Technologies for Law Enforcement and Security, (21 February 2001); doi: 10.1117/12.417516
Show Author Affiliations
Zeno J. Geradts, Netherlands Forensic Institute (Netherlands)
Dennis Zaal, Netherlands Forensic Institute (Netherlands)
Huub Hardy, Netherlands Forensic Institute (Netherlands)
Jos Lelieveld, Netherlands Forensic Institute (Netherlands)
Isaac Keereweer, Netherlands Forensic Institute (Netherlands)
Jurrien Bijhold, Netherlands Forensic Institute (Netherlands)


Published in SPIE Proceedings Vol. 4232:
Enabling Technologies for Law Enforcement and Security
Simon K. Bramble; Lenny I. Rudin; Simon K. Bramble; Edward M. Carapezza; Lenny I. Rudin, Editor(s)

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