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Proceedings Paper

Topography reconstruction of specular surfaces from a series of gray-scale images
Author(s): Soeren Kammel
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Paper Abstract

During the design and manufacturing processes of specular surfaces, waviness and shape defects may occur, reducing the quality of the surface regarding its visual appearance and/or its technical performance. Typically, these defects are only a few micrometers deep and a few centimeters wide. Beside the plain defect recognition, the reconstruction of the surface topography is of great interest, because it allows to characterize defects quantitatively. To reconstruct specular surfaces, a reflection technique based on structured-lighting is used. The specular object is considered as a part of the optical system. This technique is sensitive to changes of the slope of the surface. A series of patterns produced by an illumination system and reflected at the specular surface is observed by a camera. The distortions of the patterns in the acquired images contain information on the shape of the surface. This information is recovered through a model of the imaging function of the optical system. In contrast to previous approaches, with the proposed method it is possible to reconstruct the topography of the specular surface without an iterative approximation. This is achieved by applying a smoothness constraint to the surface data and directly calculating the surface topography from the imaging function.

Paper Details

Date Published: 12 February 2001
PDF: 9 pages
Proc. SPIE 4189, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology, (12 February 2001); doi: 10.1117/12.417188
Show Author Affiliations
Soeren Kammel, Univ. Karlsruhe Technische Hochschule (Germany)


Published in SPIE Proceedings Vol. 4189:
Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology
Kevin G. Harding; John W. V. Miller; Bruce G. Batchelor, Editor(s)

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