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Proceedings Paper

Automated alignment by hybrid video and 3D video Moire with both conventional and parallel processing
Author(s): Barbara Garita; Hector Gutierrez; Ildiko Laszlo; Joel H. Blatt
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Paper Abstract

A problem common to automated assembly in manufacturing or in automated docking of spacecraft is angular and lateral alignment of components. A hybrid video system utilizing both conventional imaging and 3-D video moiré has been developed to automatically align a test target with three translational and two rotational degrees of freedom. Alignment was demonstrated via computer controlled translation and rotation stages. The video moiré system is operated in an error map mode, in which a structurally illuminated reference surface is used to chromakey the image of an identical structurally illuminated alignment target. The output is a moiré image generated by the misalignment of the two surfaces; further processing indicates the degree and direction of the misalignment. The translation alignment error signals (x, z, zoom) are generated by conventional image processing operating on filtered or non-structurally illuminated images. In one design, translational and rotational alignments are handled by separate processors controlled by a single host, and might use synthesized images as reference: the off center and smaller image of a laterally misaligned and distant target can be zoomed and centered with respect to a synthetic image. In another design, the synthetic image is passed to the angular alignment program while translational alignment takes place, so that coarse angular alignment can proceed essentially in parallel with the lateral and range alignment. Thus both sequential and parallel processing can be utilized to solve the alignment problem.

Paper Details

Date Published: 12 February 2001
PDF: 7 pages
Proc. SPIE 4189, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology, (12 February 2001); doi: 10.1117/12.417187
Show Author Affiliations
Barbara Garita, Florida Institute of Technology (United States)
Hector Gutierrez, Florida Institute of Technology (United States)
Ildiko Laszlo, Florida Institute of Technology (United States)
Joel H. Blatt, Florida Institute of Technology (United States)


Published in SPIE Proceedings Vol. 4189:
Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology
Kevin G. Harding; John W. V. Miller; Bruce G. Batchelor, Editor(s)

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