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Proceedings Paper

Multimodal process tomography system design
Author(s): Brian S. Hoyle; Xiadong Jia; Frank J. W. Podd; H. Inaki Schlaberg; Mi Wang; Robert M. West; Richard A. Williams; Trevor A. York
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Paper Abstract

This paper presents an overview of an integrated multi-modal system designed to support a range of common modalities: electrical resistance, electrical capacitance and ultrasonic tomography. Many complex processes exhibit behaviour that changes over time and space. Such properties demand equally diverse sensing modalities. A process tomography system able to exploit multiple sensor modes must permit the integration of their data, probably centred upon a composite process model. The paper reviews the systems engineering and integrated design constraints. These include a range of hardware oriented challenges: the complexity and specificity of the front end electronics for each modality; the need for front end data pre-processing and packing; the need to integrate the data to facilitate data fusion; and finally the features to enable successful fusion and interpretation. A range of software aspects are also reviewed: the need to support differing front-end sensors for each modality in a generic fashion; the need to communicate with front end data pre-processing and packing systems; the need to integrate the data to allow data fusion; and finally to enable successful interpretation. The review of the system concepts is illustrated with an application to the study of a complex multi-component process.

Paper Details

Date Published: 2 February 2001
PDF: 10 pages
Proc. SPIE 4188, Process Imaging for Automatic Control, (2 February 2001); doi: 10.1117/12.417164
Show Author Affiliations
Brian S. Hoyle, Univ. of Leeds (United Kingdom)
Xiadong Jia, Univ. of Leeds (United Kingdom)
Frank J. W. Podd, Univ. of Leeds (United Kingdom)
H. Inaki Schlaberg, Univ. of Leeds (United Kingdom)
Mi Wang, Univ. of Leeds (United Kingdom)
Robert M. West, Univ. of Leeds (United Kingdom)
Richard A. Williams, Univ. of Leeds (United Kingdom)
Trevor A. York, Univ. of Manchester Institute of Science and Technology (United Kingdom)


Published in SPIE Proceedings Vol. 4188:
Process Imaging for Automatic Control
Hugh McCann; David M. Scott, Editor(s)

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