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Proceedings Paper

Altitude profile of the effective radius of atmospheric boundary layer aerosols retrieved from simultaneous two-wavelength lidar measurement
Author(s): Maria Cecelia D. Galvez; Edgar A. Vallar
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Paper Abstract

The altitude profile of the effective radius, reff, of atmospheric boundary layer aerosols was retrieved from simultaneous twowavelength lidar measurement near Manila Bay. The effective radius was retrieved using a simple method that makes use of the angstrom coefficient, ?, obtained from the extinction coefficients at the two wavelengths. The altitude profiles of the extinction coefficients at 532-nm and 1064-nm lidar wavelengths were obtained using Femald's inversion algorithm combined with Klett's boundary value algoritlun. used to obtain the aerosol extinction coefficient at the reference height. Assuming a lognonnal size distribution. with a geometric standard deviation of 1 .54, for atmospheric boundary layer aerosols. and a constant refractive index of 1.45 - Oi, the angstrom coefficient is determined at different mode radius, rg, using Mie Scattering Theory. A curve fitting analysis using the method-of-least-squares is done on the theoretical value of ? to obtain a sixth-order polynomial equation that gives the dependence of ? with rg. The altitude profile of reff is retrieved by using the measured value of ? into the equation. This method was applied to actual lidar experiments and the effective radius of the atmospheric boundary layer aerosols was observed to vary between 0.26 ?m to 0.29 ?m within the layer.

Paper Details

Date Published: 13 February 2001
PDF: 8 pages
Proc. SPIE 4153, Lidar Remote Sensing for Industry and Environment Monitoring, (13 February 2001); doi: 10.1117/12.417043
Show Author Affiliations
Maria Cecelia D. Galvez, De La Salle Univ. (Philippines)
Edgar A. Vallar, De La Salle Univ. (Philippines)


Published in SPIE Proceedings Vol. 4153:
Lidar Remote Sensing for Industry and Environment Monitoring
Upendra N. Singh; Upendra N. Singh; Kazuhiro Asai; Toshikasu Itabe; Toshihiro Ogawa; Nobuo Sugimoto, Editor(s)

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