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Proceedings Paper

Observation of microstructures on the recording films of Ag8In14Sb55Te23 and phthalocyanine by AFM
Author(s): Jielin Sun; Fuxi Gan
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Paper Abstract

Thin film of Ag8In14Sb55Te23 was prepared by RF-magnetron sputtering method, and the organic dye (phthalocyanine) thin film was prepared by spin coating. Micro- and submicro-size changes induced by laser irradiation on the film were studied by atomic force microscopy (AFM). The characteristic of recorded spots topography is related by recording condition (laser power, pulse width etc.) and properties of material (phase-change or shape-change). The mechanism of microstructure formation is discussed.

Paper Details

Date Published: 7 February 2001
PDF: 5 pages
Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); doi: 10.1117/12.416859
Show Author Affiliations
Jielin Sun, Shanghai Institute of Optics and Fine Mechanics (China)
Fuxi Gan, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 4085:
Fifth International Symposium on Optical Storage (ISOS 2000)
Fuxi Gan; Lisong Hou, Editor(s)

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