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Proceedings Paper

Effects of film thickness on the optical properties of AgInSbTe phase-change films
Author(s): Jinyan Li; Lisong Hou; Hao Ruan; Quan Xie; Fuxi Gan
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Paper Abstract

The optical constants of phase-change films are assumed to be constant regardless of film thickness in conventional optical design and thermal simulation of multilayer structure optical disks. However this assumption is not valid when the phase- change film thickness in the optical disks becomes very small. In this study, the dependence of the optical properties on the thickness of AgInSbTe phase-change films was investigated. The reflectivity, absorptivity, thickness and optical constant of the films were measured. The change of the extinction coefficient and refractive index become significant when the film is very thin, and become larger at shorter wavelengths such as in the blue and green region. These results are very useful in improving the accuracy of optical design and simulation of AgInSbTe phase-change optical disks, as well as in the study of phase-change optical disks at shorter wavelengths.

Paper Details

Date Published: 7 February 2001
PDF: 4 pages
Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); doi: 10.1117/12.416825
Show Author Affiliations
Jinyan Li, Shanghai Institute of Optics and Fine Mechanics (China)
Lisong Hou, Shanghai Institute of Optics and Fine Mechanics (China)
Hao Ruan, Shanghai Institute of Optics and Fine Mechanics (China)
Quan Xie, Shanghai Institute of Optics and Fine Mechanics (China)
Fuxi Gan, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 4085:
Fifth International Symposium on Optical Storage (ISOS 2000)
Fuxi Gan; Lisong Hou, Editor(s)

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