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Proceedings Paper

Influence of AIN coverlayers prepared by reactive sputtering on DyFeCo magneto-optical media
Author(s): Rui Xiong; Zuoyi Li; Xiaofei Yang; Deichen Tian; Jing Shi; Wufeng Tang
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Paper Abstract

AlNx/DyFeCo films were deposited on glass substrates by magnetron sputtering and reactive rf magnetron sputtering. The influence of AlNx coverlayers on DyFeCo magneto-optical media was studied. The results show that nitrogen surplus in AlNx leads to changes in the MO behavior of DyFeCo films due to the reaction of Dy with nitrogen. Furthermore, the influence of thickness of AlN films on the coercivity, anisotropy and eigenvalue of Kerr rotation angle of RE-TM films was investigated. The results can be explained based on the internal stress, impurities and the pinning of defects induced by 'peening effects' of high-speed atoms.

Paper Details

Date Published: 7 February 2001
PDF: 4 pages
Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); doi: 10.1117/12.416814
Show Author Affiliations
Rui Xiong, Wuhan Univ. (China) and Huazhong Univ. of Science and Technology (China)
Zuoyi Li, Huazhong Univ. of Science and Technology (China)
Xiaofei Yang, Huazhong Univ. of Science and Technology (China)
Deichen Tian, Wuhan Univ. (China)
Jing Shi, Wuhan Univ. (China)
Wufeng Tang, Wuhan Univ. (China)


Published in SPIE Proceedings Vol. 4085:
Fifth International Symposium on Optical Storage (ISOS 2000)
Fuxi Gan; Lisong Hou, Editor(s)

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