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Proceedings Paper

Optoelectronic methods for detecting a surface defect and estimation of their parameters by coherent illumination
Author(s): Dmitry K. Proskurin; V. G. Khromykh; A. S. Orlov
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Paper Abstract

Perspective of using the optoelectronic methods for remote monitoring of the quality of products surfaces is connected first of all with the possibility of their functioning in the real time. The fact, in its turn, allows one to use the information from such devices in the feedback channels of process control system when there is a need to receive surfaces with the given properties.

Paper Details

Date Published: 30 January 2001
PDF: 8 pages
Proc. SPIE 4157, Laser-Assisted Microtechnology 2000, (30 January 2001); doi: 10.1117/12.413754
Show Author Affiliations
Dmitry K. Proskurin, Voronezh State Academy of Architecture and Construction (Russia)
V. G. Khromykh, Voronezh State Univ. (Russia)
A. S. Orlov, Voronezh State Academy of Architecture and Construction (Russia)


Published in SPIE Proceedings Vol. 4157:
Laser-Assisted Microtechnology 2000
Vadim P. Veiko, Editor(s)

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