Share Email Print

Proceedings Paper

Focusing coherent x-rays with refractive optics
Author(s): Richard H. Pantell; Joseph Feinstein; H. Raul Beguiristain; Melvin A. Piestrup; Charles K. Gary; J. Theodore Cremer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Refractive lenses have been used successfully to focus incoherent x-ray emission in the wavelength range from 2 to .5A with focal lengths on the order of one meter. A stack of N lens elements is employed to reduce the focal length by the factor N over a single element, and such a lens is terms a Compound Refractive Lens (CRL). Contrary to intuition, misalignment of parabolic lens elements doesn't alter the focusing properties and results in only a small reduction in transmission. Coherent x-ray sources are being developed with wavelengths of 1-1.5A and source diameters of 50- 80micrometers , and the CRL is ideally suited to produce a small, intense image. Chromatic aberration increase the size of the image and so it is important to provide chromatic correction to minimize the image dimensions. Pulse broadening due to the dispersion of the lens material is negligible. Intensity gain is in the range from 105 to 10+$6), where gain is defined as the intensity ratio in an image plane with and without the lens in place. Maximum image intensity is obtained when the CRL is placed a distance of 100 to 200 m from the source, and the typical diameter of the focused spot is about one micron.

Paper Details

Date Published: 25 January 2001
PDF: 9 pages
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, (25 January 2001); doi: 10.1117/12.413686
Show Author Affiliations
Richard H. Pantell, Stanford Univ. (United States)
Joseph Feinstein, Stanford Univ. (United States)
H. Raul Beguiristain, Adelphi Technology Inc. (United States)
Melvin A. Piestrup, Adelphi Technology Inc. (United States)
Charles K. Gary, Adelphi Technology Inc. (United States)
J. Theodore Cremer, Adelphi Technology Inc. (United States)

Published in SPIE Proceedings Vol. 4143:
X-Ray FEL Optics and Instrumentation
Dennis M. Mills; Horst Schulte-Schrepping; John R. Arthur, Editor(s)

© SPIE. Terms of Use
Back to Top