Share Email Print
cover

Proceedings Paper

X-ray interferometric diffraction topography of crystal imperfections
Author(s): Arsen O. Aboyan; Arpat S. Avanesyan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A method for X-ray interferometric investigation of the deformation field of crystal imperfections by means of double and triple interferometers is proposed. It is shown experimentally that using double and triple interferometers one can detect segregation lines, displacement lines, as well as the Moire patterns of imperfections of different types.

Paper Details

Date Published: 25 January 2001
PDF: 6 pages
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, (25 January 2001); doi: 10.1117/12.413684
Show Author Affiliations
Arsen O. Aboyan, State Engineering Univ. of Armenia (Armenia)
Arpat S. Avanesyan, State Engineering Univ. of Armenia (Armenia)


Published in SPIE Proceedings Vol. 4143:
X-Ray FEL Optics and Instrumentation
Dennis M. Mills; Horst Schulte-Schrepping; John R. Arthur, Editor(s)

© SPIE. Terms of Use
Back to Top