Share Email Print

Proceedings Paper

Simulated annealing in the design of broadband multilayers containing more than two materials
Author(s): Keith Powell; Jamie M. Tait; Alan G. Michette
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new method of design for multilayer structures with broadband spectral responses is presented. A stochastic design approach is utilized, based upon a simulated (SA) annealing algorithm, which optimizes the multilayer structure for a particular set of criteria. In particular, we consider a mirror for which the requirement is for high reflectivity, over a broad wavelength range, in the soft x-ray region, as might be compatible with the output from a laser plasma source. The design algorithm is used to maximize a merit function for the structure by manipulating the ordering, the thickness and the material types of each of the constituent layers. The merit function may also be configured to include a number of other desirable properties for the high reflectivity mirror including broad angular response, polarization response and uniformity of reflectivity over a prescribed wavelength range.

Paper Details

Date Published: 5 January 2001
PDF: 12 pages
Proc. SPIE 4145, Advances in X-Ray Optics, (5 January 2001); doi: 10.1117/12.411645
Show Author Affiliations
Keith Powell, King's College London (United Kingdom)
Jamie M. Tait, King's College London (United Kingdom)
Alan G. Michette, King's College London (United Kingdom)

Published in SPIE Proceedings Vol. 4145:
Advances in X-Ray Optics
Alan G. Michette; Andreas K. Freund; Tetsuya Ishikawa; Sebastian Oestreich; Derrick C. Mancini; Ali M. Khounsary; Derrick C. Mancini; Alan G. Michette; Sebastian Oestreich, Editor(s)

© SPIE. Terms of Use
Back to Top