Lobster-eye optics have attracted much attention and effort in recent years due to their unique x-ray focusing capabilities. While many advances have been made in the manufacture and analysis of these optics, their characterization and the determination of their metrology remains constrained by the shortcomings of current techniques. We present a faster, better and cheaper method for the determination of many of the metrological parameters of lobster-eye optics. Optical images of the entrance and exit surfaces of an optic are taken. Applying our technique to these images allows measurement of all the geometrical properties that previously have been found to be the major contributors to focusing defects. In addition, the number of free parameters required in fitting a simulated to a measured x-ray image can be greatly reduced. We present results for the characterization of an existing lobster-eye optic and the improved modeling thereby obtained which are in very good agreement with experimental x-ray focusing data.

Date Published: 5 January 2001
PDF: 10 pages
Proc. SPIE 4145, Advances in X-Ray Optics, (5 January 2001); doi: 10.1117/12.411639

Published in SPIE Proceedings Vol. 4145:
Advances in X-Ray Optics
Alan G. Michette; Andreas K. Freund; Tetsuya Ishikawa; Sebastian Oestreich; Derrick C. Mancini; Ali M. Khounsary; Derrick C. Mancini; Alan G. Michette; Sebastian Oestreich, Editor(s)