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Proceedings Paper

Phase retrieval x-ray diffractometry (PRXRD): refraction/small-angle scattering data applications
Author(s): Karen Kit-Wan Siu; Andrei Yurievich Nikulin; James Hester; Andreas K. Freund; Tetsuya Ishikawa
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Paper Abstract

Experimental observations of refraction/small angle scattering of synchrotron radiation from non-crystalline materials are reported and discussed. This technique constitutes a further application of an experimental-analytical x-ray phase retrieval technique previously utilized for Bragg diffraction data. The recent impetus for these studies arose from high resolution measurements of x-ray refraction phenomena from a narrow aperture performed in the laboratory, which suggested that the phase retrieval formalism could also be applied to non-crystalline materials. The experiments were performed using bending magnet sources at the European Synchrotron Radiation Facility (ESRF) in France, and the Photon Factory, Japan. Refraction/small-angle scattering data was collected from thin (20 - 125 micrometer) filaments of optical fiber (silica), copper, nylon6, kapton and human hair. The experimental results obtained are in close agreement with theoretical simulations. Successful application of the phase retrieval formalism to this data will establish a basis for a novel materials characterization technique.

Paper Details

Date Published: 5 January 2001
PDF: 11 pages
Proc. SPIE 4145, Advances in X-Ray Optics, (5 January 2001); doi: 10.1117/12.411633
Show Author Affiliations
Karen Kit-Wan Siu, Monash Univ. (Australia)
Andrei Yurievich Nikulin, Monash Univ. (Australia)
James Hester, Australian Nuclear Science and Technology Organisation (Australia)
Andreas K. Freund, European Synchrotron Radiation Facility (France)
Tetsuya Ishikawa, Harima Institute and SPring-8/RIKEN-The Institute of Physical and Chemical Research (Japan)


Published in SPIE Proceedings Vol. 4145:
Advances in X-Ray Optics
Alan G. Michette; Andreas K. Freund; Tetsuya Ishikawa; Sebastian Oestreich; Derrick C. Mancini; Ali M. Khounsary; Derrick C. Mancini; Alan G. Michette; Sebastian Oestreich, Editor(s)

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