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Proceedings Paper

90-deg Bragg reflection from a thin crystalline film
Author(s): Andrei Yurievich Nikulin; John R. Davis; Brian F. Usher; Andreas K. Freund; Tetsuya Ishikawa
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Paper Abstract

Experimental observations of synchrotron radiation diffraction from a thin surface layer at a 90-degree Bragg reflection are reported and discussed. The synchrotron experiments were performed using a bending magnet source at the European Synchrotron Radiation Facility (ESRF) in France and undulator sources at the Advanced Photon Source (APS) in the U.S. and SPring-8 in Japan. Thin (0.5, 1.0 and 1.5 micron) InGaAs films deposited on a GaAs (100) substrate were studied near the 90- degree using the GaAs (800) reflection. A slight, less than 0.1%, difference in the lattice spacing between the layer and the substrate is sufficient to allow a direct and exclusive observation of the diffraction profile from a thin layer as if it was a 'free-standing' thin crystal. This research opens new possibilities for x-ray optical schemes and the development of novel analytical techniques for surface/interface x-ray diffraction studies.

Paper Details

Date Published: 5 January 2001
PDF: 11 pages
Proc. SPIE 4145, Advances in X-Ray Optics, (5 January 2001); doi: 10.1117/12.411629
Show Author Affiliations
Andrei Yurievich Nikulin, Monash Univ. (Australia)
John R. Davis, Monash Univ. (Australia)
Brian F. Usher, La Trobe Univ. (Australia)
Andreas K. Freund, European Synchrotron Radiation Facility (France)
Tetsuya Ishikawa, SPring-8/RIKEN-The Institute of Physical and Chemical Research (Japan)


Published in SPIE Proceedings Vol. 4145:
Advances in X-Ray Optics
Alan G. Michette; Andreas K. Freund; Tetsuya Ishikawa; Sebastian Oestreich; Derrick C. Mancini; Ali M. Khounsary; Derrick C. Mancini; Alan G. Michette; Sebastian Oestreich, Editor(s)

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