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Proceedings Paper

Estimating scanning characteristics from corners in bilevel images
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Paper Abstract

Degradations that occur during scanning can cause errors in Optical Character Recognition (OCR). Scans made in bilevel mode (no gray scale) from high contrast source patterns are the input to the estimation processes. Two scanner system parameters are estimated from bilevel scans using models of the scanning process and bilevel source patterns. The scanner's point spread function (PSF) width and the binarization threshold are estimated by using corner features in the scanned images. These estimation algorithms were tested in simulation and with scanned test patterns. The resulting estimates are close in value to what is expected based on gray-level analysis. The results of estimation are used to produce synthetically scanned characters that in most cases bear a strong resemblance to the characters scanned on the scanner at the same settings as the test pattern used for estimation.

Paper Details

Date Published: 21 December 2000
PDF: 8 pages
Proc. SPIE 4307, Document Recognition and Retrieval VIII, (21 December 2000); doi: 10.1117/12.410835
Show Author Affiliations
Elisa H. Barney Smith, Boise State Univ. (United States)


Published in SPIE Proceedings Vol. 4307:
Document Recognition and Retrieval VIII
Paul B. Kantor; Daniel P. Lopresti; Jiangying Zhou, Editor(s)

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