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Proceedings Paper

Scanning near-field optical microscopy of cell surfaces after structure conserving air drying
Author(s): Birgit Perner; Michael Hausmann; Leo Wollweber; Alexander Rapp; Shamci Monajembashi; Karl-Otto Greulich
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Paper Abstract

Scanning near-field optical microscopy (SNOM) can simultaneously map topographic and optical properties of surfaces with a spatial resolution between that of far-field light microscopy and electron microscopy, i.e. in the range of 100 nm. Since commercially available SNOM instruments came on the market, this technique has become interesting for the routine biological research laboratory especially in combination with far-field light imaging. However, due to the usually applied shear-force feedback controlling the SNOM tip, this technique still poses several challenges for biological applications. In our experiments for instance imaging of soft samples, large topographical changes on structurally conserved cell surfaces, and in particular the requirement for completely dried specimen had to be considered. To visualize surfaces of cells fixed on standard glass slides by SNOM, an easy to handle, optimized protocol using dehydration and hexamethyldisilazane exposure before air drying was developed. Using the commercially available instrument SNOM 210 with micro-fabricated silicon nitride tips, it was shown for several cell systems that the cellular morphology and surface structures were well preserved after this procedure of drying.

Paper Details

Date Published: 18 December 2000
PDF: 8 pages
Proc. SPIE 4164, Laser Microscopy, (18 December 2000); doi: 10.1117/12.410639
Show Author Affiliations
Birgit Perner, Institute of Molecular Biotechnology Jena (Germany)
Michael Hausmann, Institute of Molecular Biotechnology Jena (Germany)
Leo Wollweber, Institute of Molecular Biotechnology Jena (Germany)
Alexander Rapp, Institute of Molecular Biotechnology Jena (Germany)
Shamci Monajembashi, Institute of Molecular Biotechnology Jena (Germany)
Karl-Otto Greulich, Institute of Molecular Biotechnology Jena (Germany)


Published in SPIE Proceedings Vol. 4164:
Laser Microscopy
Karsten Koenig; Hans J. Tanke; Herbert Schneckenburger, Editor(s)

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