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Proceedings Paper

Measurement of coincidence timing resolution with CdTe detectors
Author(s): Yiping Shao; H. Bradford Barber; Stephen J. Balzer; Simon R. Cherry
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Paper Abstract

The coincidence timing resolution is a critical performance parameter to determine if direct gamma-ray detection by semiconductor detector material such as CdTe or CdZnTe may be suitable for use in positron emission tomography systems. We report experimental results of the coincidence timing resolution measured with a pair of 2 by 2 by 10 mm3 CdTe detectors irradiated by 511 keV gamma rays under conditions that allow good timing resolution and good energy resolution to be obtained simultaneously. The measured coincidence time resolutions ranged from 14 ns to 24 ns. We also found that the coincidence timing resolution was proportional to the signal rise time, and that both of these were proportional to the electron transit time.

Paper Details

Date Published: 18 December 2000
PDF: 11 pages
Proc. SPIE 4142, Penetrating Radiation Systems and Applications II, (18 December 2000); doi: 10.1117/12.410570
Show Author Affiliations
Yiping Shao, UCLA School of Medicine (United States)
H. Bradford Barber, Univ. of Arizona and Optical Sciences Ctr./Univ. of Arizona (United States)
Stephen J. Balzer, Univ. of Arizona and Optical Sciences Ctr./Univ. of Arizona (United States)
Simon R. Cherry, UCLA School of Medicine (United States)


Published in SPIE Proceedings Vol. 4142:
Penetrating Radiation Systems and Applications II
F. Patrick Doty; H. Bradford Barber; Hans Roehrig; Edward J. Morton, Editor(s)

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