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Proceedings Paper

High-resolution x-ray image sensors based on HgI2
Author(s): Robert A. Street; Marcelo Mulato; Steve E. Ready; Rachel Lau; Jackson Ho; Koenraad Van Schuylenbergh; Michael M. Schieber; Haim Hermon; Asaf Zuck; Alexander I. Vilensky
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Paper Abstract

Measurements of polycrystalline HgI2 films on active matrix direct detection image sensors are described, for possible application to high sensitivity room temperature x- ray detection. The arrays exhibit low leakage current and very high sensitivity - roughly an order of magnitude better than has been demonstrated with other designs. The uniformity of the response varies randomly from pixel to pixel, for reasons that are not yet understood, but are probably related to the large grain size.

Paper Details

Date Published: 18 December 2000
PDF: 8 pages
Proc. SPIE 4142, Penetrating Radiation Systems and Applications II, (18 December 2000); doi: 10.1117/12.410562
Show Author Affiliations
Robert A. Street, Xerox Palo Alto Research Ctr. (United States)
Marcelo Mulato, Xerox Palo Alto Research Ctr. (United States)
Steve E. Ready, Xerox Palo Alto Research Ctr. (United States)
Rachel Lau, Xerox Palo Alto Research Ctr. (United States)
Jackson Ho, Xerox Palo Alto Research Ctr. (United States)
Koenraad Van Schuylenbergh, Xerox Palo Alto Research Ctr. (United States)
Michael M. Schieber, Hebrew Univ. of Jerusalem (Israel)
Haim Hermon, Hebrew Univ. of Jerusalem (Israel)
Asaf Zuck, Hebrew Univ. of Jerusalem (Israel)
Alexander I. Vilensky, Hebrew Univ. of Jerusalem (Israel)


Published in SPIE Proceedings Vol. 4142:
Penetrating Radiation Systems and Applications II
F. Patrick Doty; H. Bradford Barber; Hans Roehrig; Edward J. Morton, Editor(s)

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