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Proceedings Paper

Measurements of differential cross-section for x-ray diffraction in amorphous materials using synchrotron radiation
Author(s): Regina Cely Barroso Silva; Ricardo Tadeu Lopes; Edgar F. Oliveira de Jesus; Luis Fernando de Oliveria; Marcelino J. Anjos
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Paper Abstract

Two effects should be considered when keV photons suffer elastic scattering: the scattering of photons by the bound electrons of a free atom, named Rayleigh scattering and if, besides the Rayleigh scattering, the scattering due to different atoms gives rise to interference phenomena. The interatomic and intermolecular cooperative effects which modify the free-atom coherent scattering process are well know for highly ordered structures such as crystalline materials but are important for amorphous solids and liquids where short-range ordering occurs. Amorphous materials but are important for amorphous solids and liquids where short- range ordering occurs. Amorphous materials do not give such well-defined scatter conditions, but they do still give diffraction patterns which is characteristic of the particular materia. The availability of a very intense and highly collimated synchrotron radiation beam makes possible to study scattering properties of different amorphous materials. These materials were chosen because they intend to simulate the physical properties of body tissues and human bone. All measurements, were performed at the x-ray diffraction beamline of the Laboratorio Nacional de Luz Sincrotron, in Campinas, Brazil. The x-ray diffraction measurements were carried out with an 11.101 keV x-ray beam and included data from 1 equals 0.39 to q equals 4.13 per nm.

Paper Details

Date Published: 18 December 2000
PDF: 7 pages
Proc. SPIE 4142, Penetrating Radiation Systems and Applications II, (18 December 2000); doi: 10.1117/12.410551
Show Author Affiliations
Regina Cely Barroso Silva, Univ. do Estado do Rio de Janeiro (Brazil)
Ricardo Tadeu Lopes, Univ. Federal do Rio de Janeiro (Brazil)
Edgar F. Oliveira de Jesus, Univ. Federal do Rio de Janeiro (Brazil)
Luis Fernando de Oliveria, Univ. Federal do Rio de Janeiro (Brazil)
Marcelino J. Anjos, Univ. Federal do Rio de Janiero and Univ. do Estado de Rio de Janeiro (Brazil)

Published in SPIE Proceedings Vol. 4142:
Penetrating Radiation Systems and Applications II
F. Patrick Doty; H. Bradford Barber; Hans Roehrig; Edward J. Morton, Editor(s)

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