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Proceedings Paper

High-resolution grazing incidence telescope for the Solar-B observatory
Author(s): Leon Golub; Edward E. DeLuca; Jay A. Bookbinder; Peter Cheimets; Kiyoto Shibasaki; Taro Sakao; Ryouhei Kano
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Paper Abstract

The X-ray observations from the Yohkoh SXT provided the greatest step forward in our understanding of the solar corona in nearly two decades. We believe that the scientific objectives of the Solar-B mission can best be achieved with an X-ray telescope (XRT) similar to the SXT, but with significant improvements in spatial resolution and in temperature response that take into account the knowledge gained from Yohkoh. We present the scientific justification for this view, discuss the instrumental requirements that flow from the scientific objectives, and describe the instrumentation that will meet these requirements. XRT is a grazing-incidence (GI) modified Wolter I X-ray telescope, of 35 cm inner diameter and 2.7 m focal length. The 2048 X 2048 back-illuminated CCD has 13.5 (mu) pixels, corresponding to 1.0 arcsec and giving full Sun field of view. This will be the highest resolution GI X-ray telescope ever flown for Solar coronal studies, and it has been designed specifically to observe both the high and low temperature coronal plasma.

Paper Details

Date Published: 18 December 2000
PDF: 15 pages
Proc. SPIE 4139, Instrumentation for UV/EUV Astronomy and Solar Missions, (18 December 2000); doi: 10.1117/12.410531
Show Author Affiliations
Leon Golub, Smithsonian Astrophysical Observatory (United States)
Edward E. DeLuca, Smithsonian Astrophysical Observatory (United States)
Jay A. Bookbinder, Smithsonian Astrophysical Observatory (United States)
Peter Cheimets, Smithsonian Astrophysical Observatory (United States)
Kiyoto Shibasaki, Nobeyama Radio Observatory (Japan)
Taro Sakao, Institute of Space and Astronautical Science (Japan)
Ryouhei Kano, National Astronomical Observatory of Japan (Japan)


Published in SPIE Proceedings Vol. 4139:
Instrumentation for UV/EUV Astronomy and Solar Missions
Silvano Fineschi; Clarence M. Korendyke; Oswald H. W. Siegmund; Bruce E. Woodgate, Editor(s)

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