Share Email Print
cover

Proceedings Paper

Influence of preannealing on residual stresses in boron-doped LPCVD polysilicon film
Author(s): Longqing Chen; Jianmin Miao
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An investigation of effects of variables of LPCVD process and subsequent processes on residual stresses in highly doped polysilicon film is carried out. A pre-annealing process for as- deposited polysilicon film was introduced before boron doping in order to be able to change magnitude of residual stress in a larger range. The influence of the pre-annealing on the residual stresses in boron doped polysilicon film was studied. The test results show that boron doping process induces significant residual stress only in LPCVD polysilicon films which are deposited at lower process temperature. There will not be significant doping stress in the polysilicon films if the deposition temperature is higher than 620 degrees C or pre- annealing temperature before the doping is higher than 1000 degrees C. The larger change range of the film stress can be obtained by to change pre-annealing temperature before doping. This method will be useful in the stress control of a multi-layer diaphragm structure.

Paper Details

Date Published: 23 August 2000
PDF: 4 pages
Proc. SPIE 4182, Process Control and Diagnostics, (23 August 2000); doi: 10.1117/12.410102
Show Author Affiliations
Longqing Chen, Nanyang Technological Univ. (Singapore)
Jianmin Miao, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 4182:
Process Control and Diagnostics
Michael L. Miller; Kaihan A. Ashtiani, Editor(s)

© SPIE. Terms of Use
Back to Top