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Proceedings Paper

Analysis of target detection probability in sequence image
Author(s): Haochen Liang; GuoQiang Ni; Zhenfu Zhu; Genxing Xu; Bo Song; Anjun Pan
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Paper Abstract

The detection of infrared small and puny target is the critical problem for target tracking and recognition based on imaging sensors. Being limited to the complicated environment factors, measurement scale and precision of the sensors, the measurements are uncertain, imprecise or incomplete on certain level, and thus brings the difficulty for detecting target in real image. Usually the binary hypothesis method is used to examine the potential target from background in a single frame, then the detection probability can be raised and the false alarm probability can be reduced through the method of detection multiframe of the sequence image (namely K/N rule). In this paper, the target detection probability Pd and the false alarm probability Pf for a single image is calculated on the basis of the probability density function p(ZH0) and p(ZH1) on judgment regions Z0 and Z1. In N times measurement of a sequence image, the target is detected at least K times, then it can determine that the target is existent. The Pd and Pf of K/N rule are analyzed according to single frame. Applying K/N rule, the detecting probability and the false alarm probability can meet the demands of the system if choosing the value of N and K properly.

Paper Details

Date Published: 15 December 2000
PDF: 9 pages
Proc. SPIE 4130, Infrared Technology and Applications XXVI, (15 December 2000); doi: 10.1117/12.409832
Show Author Affiliations
Haochen Liang, Beijing Institute of Technology (China)
GuoQiang Ni, Beijing Institute of Technology (China)
Zhenfu Zhu, Beijing Institute of Environmental Features (China)
Genxing Xu, Beijing Institute of Environmental Features (China)
Bo Song, Beijing Institute of Environmental Features (China)
Anjun Pan, Beijing Institute of Environmental Features (China)

Published in SPIE Proceedings Vol. 4130:
Infrared Technology and Applications XXVI
Bjorn F. Andresen; Gabor F. Fulop; Marija Strojnik, Editor(s)

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