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Proceedings Paper

Simulation of the thermal effect of laser irradiation to optimize laser epilation
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Paper Abstract

For hair removal commonly lasers are used with wavelengths being selectively absorbed by melanin .As a consequence, laser radiation leads to an increase of the temperature not only in melanin containing structures of the hair but also in the epidermis. Therefore, we simulated and studied the laser induced temperature development in tissue for various laser wavelengths and various pulse profiles. Modifying the beam parameters can improve the selectivity of the method. Monte- Carlo-Simulations were used to calculate light absorption in dermal structures, considering the tissue specific optical properties. The thermal diffusion in tissue was calculated by a finite difference method. The biological reaction due to the temperature rise was determined by an Arrhenius formalism and depends on temperature and time of laser-tissue interaction. The simulation program allows to calculate the temperature distribution and thermal damage for various temporal pulse profiles, fluence rates and irradiation geometries. Superficial cooling has an important influence and has been considered in the calculations. The results of our simulations for various laser types show differences in the thermal reaction which can be used to optimize the treatment modalities. The potential and limits of laser epilation can be estimated from these results. For example, a series of laser pulses has some advantages compared to a longer single pulse.

Paper Details

Date Published: 16 November 2000
PDF: 9 pages
Proc. SPIE 4161, Optical Biopsy and Tissue Optics, (16 November 2000); doi: 10.1117/12.409324
Show Author Affiliations
Detlef Russ, ILM/Univ. Ulm (Germany)
Alwin Kienle, ILM/Univ. Ulm (Germany)
Werner Falkenstein, Carl Baasel Lasertechnik GmbH (Germany)
Rudolf W. Steiner, ILM/Univ. Ulm (Germany)


Published in SPIE Proceedings Vol. 4161:
Optical Biopsy and Tissue Optics
Irving J. Bigio; Gerhard J. Mueller; Gerwin J. Puppels; Rudolf W. Steiner; Katarina Svanberg, Editor(s)

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