Proceedings Paper
Measuring system for registration of near-field power distribution in modes of planar and strip waveguides| Format | Member Price | Non-Member Price |
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Paper Abstract
A measuring assembly to examine the distribution of light intensity in near field of planar and strip waveguides was presented. The image of near-field intensity distribution of waveguide modes was showed as well as their interferrential changes caused by the change in optic features of waveguide structure. The presented version of the station was the one to measure the power guided in particular modes with the same polarisation states.
Paper Details
Date Published: 13 December 2000
PDF: 7 pages
Proc. SPIE 4239, Lightguides and their Applications, (13 December 2000); doi: 10.1117/12.409189
Published in SPIE Proceedings Vol. 4239:
Lightguides and their Applications
Jan Wojcik; Waldemar Wojcik, Editor(s)
PDF: 7 pages
Proc. SPIE 4239, Lightguides and their Applications, (13 December 2000); doi: 10.1117/12.409189
Show Author Affiliations
Waldemar T. Wojcik, Institute of Telecommunication (Poland)
Aleksander Opilski, Silesian Univ. of Technology (Poland)
Aleksander Opilski, Silesian Univ. of Technology (Poland)
Kazimierz Gut, Silesian Univ. of Technology (Poland)
Pawel Karasinski, Silesian Univ. of Technology (Poland)
Pawel Karasinski, Silesian Univ. of Technology (Poland)
Published in SPIE Proceedings Vol. 4239:
Lightguides and their Applications
Jan Wojcik; Waldemar Wojcik, Editor(s)
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