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Proceedings Paper

Parameters of thin films deposited on planar waveguides
Author(s): Elzbieta Augusciuk; Marcin Roszko; Wojciech Fabianowski
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Paper Abstract

Using the method of m-line spectroscopy [1] it is possible to determine parameters (thickness and refractive index) of thin films deposited on planar waveguides through indirect measurement of changes of coupling angle to the waveguide. The subject of the study were thin organic films deposited on waveguides by casting diluted polymerizable solutions, and by spin-coating thin polyimide films. These films are developed as active coatings in waveguide sensors. Numerical calculations (applied for three-layer structures) after modification to a four-layer structure allows for determining the parameters ofthin films.

Paper Details

Date Published: 13 December 2000
PDF: 3 pages
Proc. SPIE 4239, Lightguides and their Applications, (13 December 2000); doi: 10.1117/12.409183
Show Author Affiliations
Elzbieta Augusciuk, Warsaw Univ. of Technology (Poland)
Marcin Roszko, Warsaw Univ. of Technology (Poland)
Wojciech Fabianowski, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 4239:
Lightguides and their Applications
Jan Wojcik; Waldemar Wojcik, Editor(s)

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