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Proceedings Paper

Dependence of gas gain on x-ray-absorbed position in the proportional counter
Author(s): Ikuya Sakurai; Tatehiro Mihara; Nobuyuki Kawai; Atsumasa Yoshida; Yuji Shirasaki; Masaru Matuoka; Mutsumi Sugizaki; Toshikazu Kamae
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Paper Abstract

The position dependency of gas amplification in the proportional counter (PC) is investigated. We have been developing one-dimensional position sensitive PCs for MAXI/GSC and HETE/WXM and found that anomalous gas amplification occurs in a high bias voltage, even while the PC is still operated in the proportional region. This effect depends on the position where the X-ray is absorbed. Therefore it appears as a hard tail, a soft tail, or a broad peak in the traditional PC, depending on the shape of the gain curve across the cell. It degrades the apparent energy resolution. Especially, a position sensitive proportional counter (PSPC) is operated with rather high bias voltage to give higher positional resolution. We encounter the difficulty to achieve good position and energy resolutions at the same time. In this work, we have examined the anomalous gas amplification for various gas mixtures of Xe + CO2, Ar + CO2 and Ar + CH4, for gas gain up to approximately 20000, and for energies from 6 to 17 keV to understand the phenomena.

Paper Details

Date Published: 13 December 2000
PDF: 9 pages
Proc. SPIE 4140, X-Ray and Gamma-Ray Instrumentation for Astronomy XI, (13 December 2000); doi: 10.1117/12.409150
Show Author Affiliations
Ikuya Sakurai, RIKEN--The Institute of Physical and Chemical Research (Japan)
Tatehiro Mihara, RIKEN--The Institute of Physical and Chemical Research (Japan)
Nobuyuki Kawai, RIKEN--The Institute of Physical and Chemical Research (Japan)
Atsumasa Yoshida, RIKEN--The Institute of Physical and Chemical Research (Japan)
Yuji Shirasaki, National Space Development Agency of Japan (Japan)
Masaru Matuoka, National Space Development Agency of Japan (Japan)
Mutsumi Sugizaki, National Space Development Agency of Japan (Japan)
Toshikazu Kamae, Osaka City Univ. (Japan)


Published in SPIE Proceedings Vol. 4140:
X-Ray and Gamma-Ray Instrumentation for Astronomy XI
Kathryn A. Flanagan; Oswald H. W. Siegmund, Editor(s)

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