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Proceedings Paper

Fitting method for analyzing polarized x-rays on CCD camera
Author(s): Masahiro Tsujimoto; Hiroshi Murakami; Kenji Hamaguchi; Takeshi G. Tsuru; Hisamitsu Awaki; Katsuji Koyama
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Paper Abstract

CCDs can function as the X-ray spectrometer by counting the number of electrons created by the ionization of semiconductor atoms following the photoelectric absorption of an X-ray photon. In order to measure the incident X-ray energy correctly, we have to sum up all the electrons split over several pixels, thus the grade method is conventionally used. We will discuss the possible alternative to this method -- the fitting method --, which has several advantages over the grade method. By applying this method to the data taken with our CCD chip, we will show that the fitting method can improve the quantum efficiency, is applicable to the analysis of polarized X-ray events, and gives us insights on the structure of CCDs.

Paper Details

Date Published: 13 December 2000
PDF: 8 pages
Proc. SPIE 4140, X-Ray and Gamma-Ray Instrumentation for Astronomy XI, (13 December 2000); doi: 10.1117/12.409119
Show Author Affiliations
Masahiro Tsujimoto, Kyoto Univ. (Japan)
Hiroshi Murakami, Kyoto Univ. (Japan)
Kenji Hamaguchi, Kyoto Univ. (United States)
Takeshi G. Tsuru, Kyoto Univ. (Japan)
Hisamitsu Awaki, Ehime Univ. (Japan)
Katsuji Koyama, Ehime Univ. (Japan)

Published in SPIE Proceedings Vol. 4140:
X-Ray and Gamma-Ray Instrumentation for Astronomy XI
Kathryn A. Flanagan; Oswald H. W. Siegmund, Editor(s)

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