Share Email Print

Proceedings Paper

Transmission line modeling of gain saturation in microchannel plate detectors
Author(s): Leonardo Giudicotti; Giuseppe Talli
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We use the transmission line modeling (TLM) technique to model the saturation of the gain in a microchannel plate. To this purpose we represent a generic channel multiplier by a distributed constant, unidimensional electrical network in which the internal structure of the channel wall is neglected. This network is analyzed with the TLM method, i.e. with the techniques developed for transmission lines and a simple system of time-dependent, nonlinear differential equations is derived. Then we consider the system in steady-state conditions and, by introducing a rational approximation of the nonlinear gain equation, we derive an exact analytical solution from which the gain and the voltage along the channel multiplier can be easily computed. Finally the model is used to fit a set of experimental data taken with a MCP photomultiplier, finding that the derived equations describe with satisfactory accuracy the measured data.

Paper Details

Date Published: 13 December 2000
PDF: 6 pages
Proc. SPIE 4140, X-Ray and Gamma-Ray Instrumentation for Astronomy XI, (13 December 2000); doi: 10.1117/12.409113
Show Author Affiliations
Leonardo Giudicotti, INFM, Univ degli Studi di Padova, and Consorzio RFX (Italy)
Giuseppe Talli, INFM and Univ degli Studi di Padova (Italy)

Published in SPIE Proceedings Vol. 4140:
X-Ray and Gamma-Ray Instrumentation for Astronomy XI
Kathryn A. Flanagan; Oswald H. W. Siegmund, Editor(s)

© SPIE. Terms of Use
Back to Top