Share Email Print

Proceedings Paper

Preparation and optical property of island silver films embedded in silica
Author(s): Zhenquan Lai; Bin Zhou; Jue Wang; S. M. Attia; Qinyuan Zhang; Li Zhao; Jiayu Wang; Xuejian Yan
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Island silver films (nanoclusters, quantum dots) embedded in silica are prepared on silicon wafers and glasses by sputtering. Atomic force microscope is used to characterize the morphology and distribution of silver nanoclusters, the size of nanoclusters varies from several ten to several hundred nanometers. Linear optical absorption spectra of annealed samples have a blue-shift compare to that of as- prepared samples, it suggests thermal treatment decomposes large clusters to small clusters. Z-scan technique is applied to study the third-order non-linear optical properties. It is found that the embedded silver nanoclusters present remarkable third order nonlinear effect even if the size of silver nanoclusters are as large as several tens to several hundreds nanometers. Thermal treatment leads to a slight reduction in NRIC, indicating annealing also dissolve tiny nanoclusters. The size distribution of silver nanoclusters therefore becomes centralized after thermal treatment.

Paper Details

Date Published: 29 November 2000
PDF: 4 pages
Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); doi: 10.1117/12.408477
Show Author Affiliations
Zhenquan Lai, Tongji Univ. and Nanchang Univ. (China)
Bin Zhou, Tongji Univ. (China)
Jue Wang, Tongji Univ. (China)
S. M. Attia, Tongji Univ. (China)
Qinyuan Zhang, Tongji Univ. (China)
Li Zhao, Fudan Univ. (China)
Jiayu Wang, Fudan Univ. (China)
Xuejian Yan, Fudan Univ. (China)

Published in SPIE Proceedings Vol. 4086:
Fourth International Conference on Thin Film Physics and Applications
Junhao Chu; Pulin Liu; Yong Chang, Editor(s)

© SPIE. Terms of Use
Back to Top