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Proceedings Paper

Characterization of the critical behavior of Ising thin films
Author(s): Manuel I. Marques; Julio A. Gonzalo; Juan Romero; Luis F. Fonesca
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Paper Abstract

Monte Carlo calculations of Ising thin films with equal area (LXL) and different thickness (D) have been performed for D<<L. The thickness dependence of the transition temperature has been determined by the Binder Cumulant method for free and periodic boundary conditions. We find that, in the case of very small thicknesses, the expected critical temperature finite size scaling dependence holds just for the case of periodic boundary conditions. The effective critical exponents for Ising thin films have been determined all through the crossover region and before it. We determine explicitly the dimensional crossover to the 2D behavior for all exponents and for both boundary conditions. A marked under-swing effect is found for the susceptibility effective critical exponent at values of the thickness around D equals 10. Scaling relationships are checked all trough the crossover region. They seem to hold better in a zone inside the crossover region with maximum extent for values of the thicknesses around D equals 5 and become more undefined below and above this D value.

Paper Details

Date Published: 29 November 2000
PDF: 9 pages
Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); doi: 10.1117/12.408405
Show Author Affiliations
Manuel I. Marques, Univ. Autonoma de Madrid (Spain)
Julio A. Gonzalo, Univ. Autonoma de Madrid (United States)
Juan Romero, Univ. of Puerto Rico/San Juan (United States)
Luis F. Fonesca, Univ. of Puerto Rico/San Juan (United States)


Published in SPIE Proceedings Vol. 4086:
Fourth International Conference on Thin Film Physics and Applications
Junhao Chu; Pulin Liu; Yong Chang, Editor(s)

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