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Proceedings Paper

Preparation and structure investigation of AgI thin films in the silica capillary with a liquid phase deposition technique
Author(s): Tianfa Wen; Jianping Gao; Jiuming Zhang; Beiya Bian; Juyun Shen
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Paper Abstract

A metal (Ag)/dielectric (AgI) hollow glass waveguide is an attractive and flexible for easy handling mid-IR fiber used in the systems of Er:YAG lasers and high-power CO2 lasers radiation transmission. The quality of AgI thin films is one of the key factors, which greatly influence on the attenuation of waveguides. In this paper, with a liquid- phase deposition technique AgI thin films were successfully fabricated in the silica capillary, whose inner diameter was 0.53 mm. By means of XRD, AFM and AES, the process of iodination and the structure of AgI thin films were firstly investigated. It can be concluded that the AgI phase in the AgI films was a mixture of (beta) -AgI and (gamma) -AgI which converts slowly to (beta) -AgI in the iodination process. And the interface of AgI film, Ag film, and substrate is obviously distinguished and the thickness of AgI films can be measured directly about 0.625 micrometers .

Paper Details

Date Published: 29 November 2000
PDF: 4 pages
Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); doi: 10.1117/12.408385
Show Author Affiliations
Tianfa Wen, Shanghai Institute of Ceramics (China)
Jianping Gao, Shanghai Institute of Ceramics (China)
Jiuming Zhang, Shanghai Institute of Ceramics (China)
Beiya Bian, Shanghai Institute of Ceramics (China)
Juyun Shen, Shanghai Institute of Ceramics (China)


Published in SPIE Proceedings Vol. 4086:
Fourth International Conference on Thin Film Physics and Applications
Junhao Chu; Pulin Liu; Yong Chang, Editor(s)

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