Share Email Print
cover

Proceedings Paper

Refractive index modifications and thermal properties of optical thin films with the prism coupler
Author(s): Francois Flory; Pascal Huguet-Chantome; Ludovic Escoubas; Serge Monneret
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The prism coupler can be used with a single beam to measure the refractive indices of isotropic or anisotropic single layers and of layers in multilayer stacks with an accuracy of 1. X 10-3. The refractive index modification with temperature can also be measured easily. The refractive index of a thin film can also change under illumination. A two-beam set-up has been developed to achieve a very high sensitivity of 1. X 10-6 on the refractive index changes. The nonlinear response of the layer's materials is mainly due to thermal effects. As well the diffusion length of the effect as the frequency response are measured even for low absorbing thin films. Examples of measurements are given. The heat equations permit to calculate the temperature distribution in the whole system so that both theoretical and experimental means can now be used to determine thermal properties of materials in thin film form.

Paper Details

Date Published: 29 November 2000
PDF: 5 pages
Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); doi: 10.1117/12.408381
Show Author Affiliations
Francois Flory, Ecole Nationale Superieure de Physique de Marseille (France)
Pascal Huguet-Chantome, Ecole Nationale Superieure de Physique de Marseille (France)
Ludovic Escoubas, Ecole Nationale Superieure de Physique de Marseille (France)
Serge Monneret, Ecole Nationale Superieure de Physique de Marseille (France)


Published in SPIE Proceedings Vol. 4086:
Fourth International Conference on Thin Film Physics and Applications
Junhao Chu; Pulin Liu; Yong Chang, Editor(s)

© SPIE. Terms of Use
Back to Top