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Proceedings Paper

Substrate stress effect on phase transition properties of ferroelectric films from Landau theory
Author(s): C. L. Wang; X. S. Wang; Y. Xin; W. L. Zhong; P. L. Zhang
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Paper Abstract

The influence of film/substrate stress on the phase transition property of ferroelectric thin films has been investigated from Landau theory. The stress is introduced through a coupling term of stress and polarization in the expression of free energy. The stress is assumed decreasing exponentially away from the substrate. Profiles and temperature dependence of polarization have been obtained for films with different strength of stress. The extensive stress reduces the polarization and shifts the Curie temperature to a low temperature; whilst the tensile stress enhances the polarization and shifts the Curie temperature to a high temperature, even higher than that of corresponding bulk Curie temperature if the tensile stress is strong enough.

Paper Details

Date Published: 29 November 2000
PDF: 4 pages
Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); doi: 10.1117/12.408360
Show Author Affiliations
C. L. Wang, Shandong Univ. (China)
X. S. Wang, Shandong Univ. (China)
Y. Xin, Shandong Univ. (China)
W. L. Zhong, Shandong Univ. (China)
P. L. Zhang, Shandong Univ. (China)


Published in SPIE Proceedings Vol. 4086:
Fourth International Conference on Thin Film Physics and Applications
Junhao Chu; Pulin Liu; Yong Chang, Editor(s)

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