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Proceedings Paper

Optical properties and the mechanism of BaxSr1-xTiO3 ferroelectric thin films prepared by sol-gel method
Author(s): Chengyu Jin; Zhongyan Meng
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Paper Abstract

Ultraviolet-visible spectrophotometer was used to study optical properties of BaxSr1-xTiO3 (BST) system ferroelectric thin films derived by sol-gel process. Transmission spectrum show that the thickness, refractive index and the optical band gap of films on fused silica are changed with annealing conditions due to the densification with pore collapse and the phase transformation. The refractive index n of BaTiO3, Ba0.7Sr0.3TiO3, SrTiO3, and Ba0.7Sr0.3TiO3+1at%Mn thin films annealed at 800 degree(s)C are about 1.987, 1.902, 1.8 and 2.044 at 450 nm, 550 nm, 650 nm, and 550 nm, respectively. The bandgap of well-crystallized BST thin films is about 3.63 eV.

Paper Details

Date Published: 29 November 2000
PDF: 6 pages
Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); doi: 10.1117/12.408347
Show Author Affiliations
Chengyu Jin, Shanghai Univ. (China)
Zhongyan Meng, Shanghai Univ. (China)

Published in SPIE Proceedings Vol. 4086:
Fourth International Conference on Thin Film Physics and Applications
Junhao Chu; Pulin Liu; Yong Chang, Editor(s)

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