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Proceedings Paper

Characterization of multi-element CZT arrays
Author(s): Leonard J. Cirignano; Kanai S. Shah; Paul R. Bennett; Longxia Li; Fengying Lu; Joseph Buturlia; H. Walter Yao; Gomez W. Wright; Ralph B. James
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Paper Abstract

We report on device fabrication and testing of CZT grown by the Modified Vertical Bridgman (MVB) method. Several samples of single-crystal MVB grown CZT were obtained from Yinnel Tech. Both single element devices and 2-dimensional arrays were fabricated. Resistivity and electron mobility-lifetime product were measured, and pulse height spectra were recorded for various isotopic sources. Arrays 5 mm thick and an array 1.13-cm thick were evaluated.

Paper Details

Date Published: 21 November 2000
PDF: 6 pages
Proc. SPIE 4141, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II, (21 November 2000); doi: 10.1117/12.407600
Show Author Affiliations
Leonard J. Cirignano, Radiation Monitoring Devices, Inc. (United States)
Kanai S. Shah, Radiation Monitoring Devices, Inc. (United States)
Paul R. Bennett, Radiation Monitoring Devices, Inc. (United States)
Longxia Li, Yinnel Tech, Inc. (United States)
Fengying Lu, Yinnel Tech, Inc. (United States)
Joseph Buturlia, Thermo Electron Tecomet (United States)
H. Walter Yao, Sandia National Labs. (United States)
Gomez W. Wright, Sandia National Labs. (United States)
Ralph B. James, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 4141:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II
Ralph B. James; Richard C. Schirato, Editor(s)

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