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Proceedings Paper

Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals
Author(s): Gomez W. Wright; Ralph B. James; Douglas Chinn; Bruce Andrew Brunett; Richard W. Olsen; John M. Van Scyoc; W. Miles Clift; Arnold Burger; Kaushik Chattopadhyay; Detang T. Shi; Robert Cam Wingfield
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Paper Abstract

Various passivating agents that reduce the surface leakage current of CZT crystals have been previously reported. In none of the studies, NH4F/H2O2 was identified as a promising passivation agent for CZT. We now present a study that includes the effect of NH4F/H2O2 treatment on the surface properties and detector performance. An elemental depth profile was obtained via Auger Electron Spectroscopy. Furthermore, X-ray Photoelectron Spectroscopy acquired at different processing times to identify the chemical states of the elemental species that composed the dielectric layer. It was found that the NH4F/H2O2 surface passivation significantly improved the sensitivity and energy resolution of CZT detectors. Furthermore, the NH4F/H2O2 treatment did not attack the Au electrodes, which eliminated the need to protect the contacts in the detector fabrication process.

Paper Details

Date Published: 21 November 2000
PDF: 12 pages
Proc. SPIE 4141, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II, (21 November 2000); doi: 10.1117/12.407594
Show Author Affiliations
Gomez W. Wright, Sandia National Labs. and Fisk Univ. (United States)
Ralph B. James, Sandia National Labs. (United States)
Douglas Chinn, Sandia National Labs. (United States)
Bruce Andrew Brunett, Sandia National Labs. (United States)
Richard W. Olsen, Sandia National Labs. (United States)
John M. Van Scyoc, Sandia National Labs. (United States)
W. Miles Clift, Sandia National Labs. (United States)
Arnold Burger, Fisk Univ. (United States)
Kaushik Chattopadhyay, Fisk Univ. (United States)
Detang T. Shi, Fisk Univ. (United States)
Robert Cam Wingfield, Fisk Univ. (United States)


Published in SPIE Proceedings Vol. 4141:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II
Ralph B. James; Richard C. Schirato, Editor(s)

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