Share Email Print
cover

Proceedings Paper

Scanned x-ray images from a linear CdZnTe pad array with monolithic readout electronics
Author(s): Martin Clajus; Tumay O. Tumer; Gerald J. Visser; Shi Yin; Paul D. Willson; Lawrence J. D'Aries; Kevin B. Parnham; Bruce Glick; John L. Perry; Thomas D. Gamble; Geoffrey Creede; Eric Worthington; John Sparling; Dale G. Maeding; Dan Gorzen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A linear CdZnTe pad detector array with approximately 1 mm2 pad area has been developed. The detector has a wide energy range from about 20 to 200 keV. To read out these detector arrays, a fast, low-noise monolithic mixed signal ASIC chip has been developed. A prototype x-ray imaging system consisting of the CdZnTe detector array and the monolithic ASIC chip has been fabricated and tested. In this system, the detectors are abutted against each other to form an approximately 1 m long linear array. The system has been used to take preliminary scanned images of complex objects at various energies. New results from this system will be presented.

Paper Details

Date Published: 21 November 2000
PDF: 7 pages
Proc. SPIE 4141, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II, (21 November 2000); doi: 10.1117/12.407590
Show Author Affiliations
Martin Clajus, NOVA R&D, Inc. (United States)
Tumay O. Tumer, NOVA R&D, Inc. (United States)
Gerald J. Visser, NOVA R&D, Inc. (United States)
Shi Yin, NOVA R&D, Inc. (United States)
Paul D. Willson, U.S. Army Armament Research and Development Engineering Ctr. (United States)
Lawrence J. D'Aries, U.S. Army Armament Research and Development Engineering Ctr. (United States)
Kevin B. Parnham, eV Products (United States)
Bruce Glick, eV Products (United States)
John L. Perry, ENSCO, Inc. (United States)
Thomas D. Gamble, ENSCO, Inc. (United States)
Geoffrey Creede, ENSCO, Inc. (United States)
Eric Worthington, ENSCO, Inc. (United States)
John Sparling, ENSCO, Inc. (United States)
Dale G. Maeding, Innovative Design (United States)
Dan Gorzen, X-Ray & Specialty Instruments (United States)


Published in SPIE Proceedings Vol. 4141:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II
Ralph B. James; Richard C. Schirato, Editor(s)

© SPIE. Terms of Use
Back to Top