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Proceedings Paper

High-accuracy x-ray foil optic assembly
Author(s): Glen P. Monnelly; Olivier Mongrard; David Breslau; Nat Butler; Carl G. Chen; Lester M. Cohen; Wendy Gu; Ralf K. Heilmann; Paul T. Konkola; George R. Ricker; Mark L. Schattenburg
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Paper Abstract

Achieving arcsecond angular resolution in a grazing-incidence foil optic X-ray telescope, such as the segmented mirror approach being considered for the Constellation-X Spectroscopy X-Ray Telescope (SXT), requires accurate placement of individual foils. We have developed a method for mounting large numbers of nested, segmented foil optics with sub- micrometer accuracy using lithographically defined and etched silicon alignment micro-structures. A system of assembly tooling, incorporating the silicon micro-structures, is used to position the foils which are then bonded to a flight structure. The advantage of this procedure is that the flight structure has relaxed tolerance requirements while the high accuracy assembly tooling can be reused. A companion paper by Bergner et al. discusses how our process could be used for the SXT. We have built an assembly truss with a simplified rectilinear geometry designed to experimentally test this alignment and mounting technique. We report results of tests with this system that demonstrate its ability to provide sub- micrometer alignment of rigid test optics.

Paper Details

Date Published: 28 November 2000
PDF: 10 pages
Proc. SPIE 4138, X-Ray Optics, Instruments, and Missions IV, (28 November 2000); doi: 10.1117/12.407556
Show Author Affiliations
Glen P. Monnelly, Massachusetts Institute of Technology (United States)
Olivier Mongrard, Massachusetts Institute of Technology (United States)
David Breslau, Massachusetts Institute of Technology (United States)
Nat Butler, Massachusetts Institute of Technology (United States)
Carl G. Chen, Massachusetts Institute of Technology (United States)
Lester M. Cohen, Smithsonian Astrophysical Observatory (United States)
Wendy Gu, Massachusetts Institute of Technology (United States)
Ralf K. Heilmann, Massachusetts Institute of Technology (United States)
Paul T. Konkola, Massachusetts Institute of Technology (United States)
George R. Ricker, Massachusetts Institute of Technology (United States)
Mark L. Schattenburg, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 4138:
X-Ray Optics, Instruments, and Missions IV
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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