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Proceedings Paper

Laser-induced fluorescence for discrimination of crops and weeds
Author(s): Peter J. Hilton
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Paper Abstract

This paper reports the use of Laser Induced Fluorescence (LIF) of plants to discriminate between crops and weeds for potential use in an intelligent crop spraying system. Past and current work in intelligent crop spraying has concentrated on using multi-spectral reflectance data in particular using near infrared (NIR) and color. Texture and shape image processing has also been used with limited success and is usually computationally expensive. Also, most of these approaches are error prone since they rely on ambient solar illumination and so are susceptible to errors caused by cloud variations, shadows and other non-uniformities. There are several commercial spraying systems available that detect presence or absence of plants using the NIR 'red-edge' effect without discrimination between species. 'Weedseeker' and 'Detectspray' are two examples of such systems, the 'Weedseeker' system being one of the few active systems, incorporating its own light source. However, both systems suffer from poor spatial resolution. The use of plant or chlorophyll fluorescence for discrimination between species is a relatively under researched area. This paper shows that LIF of several crops and weeds can be used to discriminate between species. Spectra are presented for two crop and two weed species over a range of discrete laser excitation wavelengths. The technique can be directly implemented with a laser imaging system for real-time detection and discrimination of crops and weeds.

Paper Details

Date Published: 22 November 2000
PDF: 9 pages
Proc. SPIE 4124, High-Resolution Wavefront Control: Methods, Devices, and Applications II, (22 November 2000); doi: 10.1117/12.407504
Show Author Affiliations
Peter J. Hilton, Industrial Research Ltd. (New Zealand)


Published in SPIE Proceedings Vol. 4124:
High-Resolution Wavefront Control: Methods, Devices, and Applications II
John D. Gonglewski; Mikhail A. Vorontsov; Mark T. Gruneisen, Editor(s)

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