Share Email Print

Proceedings Paper

High-resolution curvature sensing
Author(s): Shirly Vinikman Pinchasi; Erez N. Ribak
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Curvature sensing is a non-interferometric wave front sensing method. Its resolution is only limited by the sensor resolution, and it only requires one pixel for each point. In order to understand its applicability it was tested in a controlled laboratory environment. We tried various optical configurations and different data processing methods, such as Projection on convex sets and finite elements. In edition it is presented that a simple silicon wafer, on the back of which porous silicon is etched, can serve as deformable mirror. This is the first report, to our knowledge, of the piezoelectric and piezo-optic response of porous silicon.

Paper Details

Date Published: 22 November 2000
PDF: 8 pages
Proc. SPIE 4124, High-Resolution Wavefront Control: Methods, Devices, and Applications II, (22 November 2000); doi: 10.1117/12.407493
Show Author Affiliations
Shirly Vinikman Pinchasi, Technion--Israel Institute of Technology (Israel)
Erez N. Ribak, Technion--Israel Institute of Technology (Israel)

Published in SPIE Proceedings Vol. 4124:
High-Resolution Wavefront Control: Methods, Devices, and Applications II
John D. Gonglewski; Mikhail A. Vorontsov; Mark T. Gruneisen, Editor(s)

© SPIE. Terms of Use
Back to Top