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Proceedings Paper

XM-1: the high-resolution soft x-ray microscope at the Advanced Light Source
Author(s): Angelic L. Pearson; Weilun Chao; Gregory Denbeaux; Thomas Eimueller; Peter Fischer; Lewis E. Johnson; Matthias Koehler; Carolyn Larabell; Mark A. LeGros; Deborah Yager; David T. Attwood
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Paper Abstract

The XM-1 soft x-ray microscope utilizes bending-magnet radiation from the Advanced Light Source in Berkeley, CA. This radiation is collected by a `large' (9 mm diameter) fresnel condenser zone plate which projects light through a pinhole and illuminates the sample. The radiation transmitted through the sample is then focused and magnified by a high-precision objective micro zone plate and recorded by a soft x-ray CCD camera. Our condenser zone plate and pinhole combination serves ad our adjustable monochromator for selecting the desired photon energy, giving us a (lambda) /(Delta) (lambda) of 700. This moderate spectral resolution allows for spectroscopic imaging with XM-1, including samples of magnetic materials with contrast provided by magnetic circular dichroism. Our user-friendly software programs allow for frequent utilization of complex image processing techniques.

Paper Details

Date Published: 8 November 2000
PDF: 6 pages
Proc. SPIE 4146, Soft X-Ray and EUV Imaging Systems, (8 November 2000); doi: 10.1117/12.406672
Show Author Affiliations
Angelic L. Pearson, Lawrence Berkeley National Lab. (United States)
Weilun Chao, Lawrence Berkeley National Lab. (USA) and Univ. of California/Berkeley (United States)
Gregory Denbeaux, Lawrence Berkeley National Lab. (United States)
Thomas Eimueller, Univ. Wuerzburg (Germany)
Peter Fischer, Lawrence Berkeley National Lab. (USA) and Univ. Wuerzburg (Germany)
Lewis E. Johnson, Lawrence Berkeley National Lab. (United States)
Matthias Koehler, Univ. Wuerzberg (Germany)
Carolyn Larabell, Lawrence Berkeley National Lab. (United States)
Mark A. LeGros, Lawrence Berkeley National Lab. (United States)
Deborah Yager, Lawrence Berkeley National Lab. (United States)
David T. Attwood, Lawrence Berkeley National Lab. (USA) and Univ. of California/Berkeley (United States)


Published in SPIE Proceedings Vol. 4146:
Soft X-Ray and EUV Imaging Systems
Winfried M. Kaiser; Richard H. Stulen, Editor(s)

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