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Proceedings Paper

Half-wave infrared reflection retarders using two-dimensional ZnS surface-relief grating on Au substrate at 45-deg. angle of incidence
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Paper Abstract

External-reflection phase retarders with high reflectance have been of interest for many years. 1-7 By selecting the angle of incidence, film thickness, and refractive indices of both the film and metallic substrate, the p- and s-polarized components of incident monochromatic light can be reflected equally and with a specified differential reflection phase shift introduced beween them. In general, these studies involved isotropic films. Azzam and Perilloux1 discussed the constraint on the optical constants of a film-substrate system such that it functions as a quarter-wave retarder (QWR) or half-wave retarder (HWR) at incidence angles of 70° and 45°, respectively.

Paper Details

Date Published: 15 November 2000
PDF: 10 pages
Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); doi: 10.1117/12.406636
Show Author Affiliations
Jian Liu, Lucent Technologies (United States)
Rasheed M. A. Azzam, Univ. of New Orleans (United States)

Published in SPIE Proceedings Vol. 4133:
Polarization Analysis, Measurement, and Remote Sensing III
David B. Chenault; Walter G. Egan; Michael J. Duggin; Michael J. Duggin; Walter G. Egan; Dennis H. Goldstein, Editor(s)

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